OLYNPOS MX61L

Semiconductor /FPD examination microscope MX61L, reflective illumination microscope is an upgraded version of OLYMPUS MX61, L is long working distance, suitable for large platform microscope with a maximum of 300mm sample.

Electric model for 300mm wafer and 17-inch FPD glass substrate (both for reflection and transmission)

A variety of observation methods should be used to observe fluorescence in open field. When changing the objective lens, it can adjust the brightness aperture automatically, so as to achieve a comfortable inspection environment. Equipped with a 14 x 12 inch cargo platform, capable of handling large samples.